1994
55. R. Gerhardt, “Impedance and Dielectric Spectroscopy Revisited: Distinguishing Localized Relaxation from Long-Range Conductivity,” J. Phys. Chem. Solids. 55[12], 1491-1506 (1994). Published online 8 May 2003. (DOI: 10.1016/0022-3697(94)90575-4)
54. J.C. Kaplan and R.A. Gerhardt, “Effect of Trace Carbon on the UV-Induced Behavior of Aluminum Nitride Ceramics,” J. Mat. Res. 9 [9], 2209-2212 (1994). Published online 3 Mar 2011. (DOI: 10.1557/JMR.1994.2209)
53. R.A. Gerhardt, J.R. Kokan and P.A. Kohl, “Low Permittivity Porous Silica Thin Films for MCM-C/D Applications,” in Advances in Ceramics Multi-chip Module(MCM) and High Performance Electronic Materials (ed. W.K. Jones) Kluwer Academic Publishers, Dordrecht, pp. 209-219 (1994). (DOI: 10.1007/978-94-011-0079-3_22)
52. J.C. Kaplan and R.A. Gerhardt, “Effect of Trace Impurities on UV Irradiation Induced Changes in Aluminum Nitride Substrates,” ISHM Proc. 27th Int. Symp. on Microelectronics, 415-420 (1994). (ISBN: 0930815416)
51. H.M. Kerch, H.E. Burdette, R.A. Gerhardt, S. Krueger and G.G. Long, “In-Situ Microstructure Characterization of Sintering of Controlled Porosity Materials,” Mat.Res.Soc.Symp.Proc. 346, 177-182 (1994). (DOI: 10.1557/PROC-346-177)
50. J.R. Kokan, F. Tadayon, R.A. Gerhardt and P.A. Kohl, “Sol-Gel Processing of Porous Silica Thin Films for Interlevel Dielectrics in Integrated Circuits,” IEEE Proc. 44th Annual Electron Components and Technology Conference, pp. 704-711 (1994). (DOI: 10.1109/ECTC.1994.367593)
49. R. Gerhardt, “Microstructural Characterization of Composites via Electrical Measurements,” Ceram. Eng. Sci. Proc. 15[5], 1174-1181 (1994). Published online 28 March 2008. (DOI: 10.1002/9780470314555.ch67)
1993
48. H.M. Kerch, F. Cosandey and R. Gerhardt, “Imaging of Fine Porosity in a Colloidal Silica: Potassium Silicate Gel by Defocus Contrast Microscopy,” J. Non-Cryst. Solids 152, 18-31(1993). Published online 18 April 2003. (DOI: 10.1016/0022-3093(93)90440-9)
1991
47. G.G. Long, S. Krueger, R.A. Gerhardt and R.A. Page, “Small-Angle Neutron Scattering Characterization of Processing/Microstructure Relationships in the Sintering of Crystalline and Glassy Ceramics,” J. Mat. Res. 6 [12], 2706-2715 (1991). Published online 31 Jan. 2011. (DOI: 10.1557/JMR.1991.2706)
1990
46. F. D’Orazio, S. Bhattacharja, W.P. Halperin and R. Gerhardt, “Fluid transport in partially filled porous sol-gel silica glass,” Phys. Rev. B. 42 [10], 6503-6508 (1990). (DOI: 10.1103/PhysRevB.42.6503)
45. W. Cao and R. Gerhardt, “Calculation of Various Relaxation Times and Conductivity for a Single Dielectric Relaxation Process,” Solid State Ionics 42, 213-221 (1990). Published online 24 July 2002. (DOI: 10.1016/0167-2738(90)90010-O)
44. G.G. Long, S. Krueger, P.R. Jemian, D.R. Black, H.A. Burdette, J.P. Cline and R.A. Gerhardt, “Small-Angle-Scattering Determination of the Microstructure of Porous Silica Precursor Bodies,” J. Appl. Cryst. 23, 535-544 (1990). (DOI: 10.1107/S0021889890008263)
43. H.M. Kerch, R. Gerhardt and J. Grazul, “Quantitative Electron Microscopic Investigation of the pore structure in 10:90 Colloidal Silica/Potassium Silicate Sol-Gels,” J. Am. Ceram. Soc. 73[8],2228-2237 (1990). Published online 8 Mar 2005. (DOI: 10.1111/j.1151-2916.1990.tb07581.x)
42. R. Gerhardt and T.R. Grossman, “Characterization of Porosity in Thermal Barrier Coatings,” Chapter in Ceramic Thin and Thick Films: Ceramic Transactions, Volume 11, American Ceramic Society, pp. 189-200 (1990). (ISBN: ISBN: 0944904270)
41. W. Cao, R. Gerhardt and J.B. Wachtman, Jr., “Dielectric Relaxation of Water Adsorbed on Monolithic Porous Silica Gels,” Chapter in Ceramic Dielectrics: Composition, Processing and Properties: Ceramic Transactions, Volume 8, American Ceramic Society, pp. 175-184 (1990). (ISBN: 9780944904220)
40. W. Cao, R. Gerhardt and J.B. Wachtman, Jr., “Effect of Sodium Ions on the Dielectric Conductivity of Porous Silica in Humid Environments,” Mat. Res. Soc. Symp. Proc. vol. 195: 471-476 (1990). (DOI: 10.1557/PROC-195-471)
39. G.G. Long, S. Krueger, D.R. Black, J.P. Cline, P.R. Jemian and R. Gerhardt, “Small Angle Neutron Scattering and Small Angle X-Ray Scattering from Bulk Microporous Silica,” Mat. Res. Soc. Symp. Proc. vol. 166, 421-426 (1990). (DOI: 10.1557/PROC-166-421)
38. Siu-Wai Chan, D.M. Hwang, R. Ramesh, S. M. Sampere, L. Nazar, R. Gerhardt and P. Pruna, “Study of YBa2Cu3O7-x Thin Films Grown on Single Crystal SrTiO3: Not All High Angle Boundaries Destroy Jc,” AIP Conf. Proceedings 200, 172-185 (1990). (DOI: 10.1063/1.39040)
37. H.M. Kerch and R. Gerhardt, “Quantitative Stereological Analysis of the Pore Size Distribution in a Colloidal Silica Sol Gel,” in ELECTRON MICROSCOPY 1990 vol. 4, ed. L.D. Peachey and D.B. Williams, pp. 1078-1079 (1990).
36. R. Gerhardt and R. Ruh, “Electrical Properties of SiC-reinforced Mullite Composites,” Extended Abstracts of the Electronics Division at the 92nd Annual Meeting of the American Ceramic Society, May 1990.
35. R. Gerhardt and Siu-Wai Chan, “Microstructural Dependence of the Superconducting Properties in Mixed Phase Samples,” Extended Abstracts of the Electronics Division at the 92nd Annual Meeting of the American Ceramic Society, May 1990.
34. A. Lam, R. Gerhardt, Siu-Wai Chan, B.J. Wilkens and S. Sampere, “Compositional Analysis of YBaCuO Thin Films,” Extended Abstracts of the Electronics Division at the 92nd Annual Meeting of the American Ceramic Society, May 1990.