1999
89. W-Y Lin, R.A. Gerhardt and R.F. Speyer, “Thermal Processing and Properties of BaTi4O9 and Ba2Ti9O20 Dielectric Resonators,” J.Mat.Sc. 34[12], 3021-3025 (1999). (DOI: 10.1023/A:1004624510902)
88. H.M. Kerch, G.G. Long, S. Krueger, R.A. Gerhardt and F. Cosandey, “Characterization of Porosity Over Many Length Scales: Application to Colloidal Gels,” J.Mat.Res. 14[4], 1444-1454 (1999). Published online 31 Jan. 2011. (DOI: 10.1557/JMR.1999.0195)
87. M. Dong and R.A. Gerhardt, “Electrical Characterization of Sol-Gel Derived Pb(Zr,Ti)O3 Ceramics,” Chapter in Dielectric Ceramic Materials: Ceramic Transactions, Volume 100, American Ceramic Society, pp. 367-375 (1999). (ISBN: 978-1-57498-066-0)
86. R.A. Gerhardt, B. Lawless and D.J. Roth, “Impedance Spectroscopy of Waspaloy as a function of Thermal Exposure,” 3rd FAA/DOD/NASA Conference on Aging Aircraft, 1-14 (1999).
85. R.A. Gerhardt, J.R. Kokan, D.J. Roth, B.A. Lerch and B. Lawless, “Novel Electrical Method for Detecting Microstructural Changes in Aged Ni-Based Alloys,” Proceedings of the NASA Hitemp Conf. Vol. 2, 325-345 (1999).
1998
84. R.A. Gerhardt, M.A. Alim and S.R. Taylor, eds., Electrically based microstructural characterization II, Materials Research Society Proceedings Volume 500, 395 pages (1998). (ISBN: 1-55899-405-X)
83. R.A. Gerhardt, “Causes of dielectric dispersion in ferroelectric materials,” Chapter in Advances in Dielectric Ceramic Materials: Ceramic Transactions, Volume 88, American Ceramic Society, pp. 41-60 (1998). (ISBN: 1-57498-013-0)
82. D.W. Riley and R.A. Gerhardt, “Effect on Porosity on the Optical Properties of Anodized Porous Silicon Thin Films,” IEEE Proc. CEIDP, 248-251 (1998). (DOI: 10.1109/CEIDP.1998.733952)
81. J.R. Kokan, R.A. Gerhardt and R. Ruh, “Electrical Properties of BN-B4C and BN-SiC Composites,” IEEE Proc. CEIDP, 252-255 (1998). (DOI: 10.1109/CEIDP.1998.733955)
80. M.Dong and R.A. Gerhardt, “Frequency and Temperature Dependence of the Dielectric Properties of Ferroelectric Materials,” IEEE Proc. CEIDP, 327-330 (1998). (DOI: 10.1109/CEIDP.1998.733998)
79. E.D. Birdsell and R.A. Gerhardt, “Porous Silica: A Potential Material for Low Dielectric Constant Applications,” Mat.Res.Symp.Proc. Vol. 511, 111-116 (1998). (DOI: 10.1557/PROC-511-111)
78. J.R. Kokan, R.A. Gerhardt , R. Ruh and D.S. McLachlan, “Dielectric Spectroscopy of Insulator-Conductor Mixtures,” Mat.Res.Symp.Proc. Vol. 500, 341-346 (1998). (DOI: 10.1557/PROC-500-341)
77. J.R. Kokan, R.A. Gerhardt and C-H Su, “Dielectric Spectroscopy of ZnSe Grown by Physical Vapor Transport,” Mat.Res.Symp.Proc. Vol. 487, 517-522 (1998). (DOI: 10.1557/PROC-487-517)
76. M. Dong and R.A. Gerhardt, “Complex Dielectric Spectroscopy of a Li0.982Ta1.004O3 Ferroelectric Single Crystal,” Mat.Res.Symp.Proc. Vol. 500, 195-200 (1998). (DOI: 10.1557/PROC-500-195)
75. R.A. Gerhardt and D.S. McLachlan, “Frequency Behavior of Percolating Systems,” Progress in Electromagnetics Research Extended Abstracts, July 1998.
74. Y. Berta and R.A. Gerhardt, “Microstructure of Porous Silicon Thin Films,” Microscopy and Microanalysis vol. 4 (Suppl. 2: Proc. Eds. G.W. Bailey, K.B. Alexander, W.G. Jerome, M.G. bond, J.J. McCarthy) Springer 1998, pp. 632-633. (ISBN: 1431-9276)
73. Y. Berta and R.A. Gerhardt, “Carbon Induced UV Sensitivity in Aluminum Nitride,” Microscopy and Microanalysis vol. 4 (Suppl. 2: Proc. Eds. G.W. Bailey, K.B. Alexander, W.G. Jerome, M.G. Bond, J.J. McCarthy) Springer 1998, pp. 570-571. (ISBN: 1431-9276)
72. D.W. Riley and R.A. Gerhardt, “A Layer Stacking Model for Porous Silicon Film Growth,” Extended Abstracts of International Conference PSST-98, 218-219 (1998).
1997
71. Y. Kim, R.A. Gerhardt and A. Erbil, “Dynamical Properties of Epitaxial Ferroelectric Heterostructures,” Phys.Rev.B.55, 4477-4485 (1997-II). (DOI: 10.1103/PhysRevB.55.8766)
70. W.Y. Lin, R.A. Gerhardt, R.F. Speyer, W.S. Hackenberger and T.R. Shrout, “Fabrication and Dielectric Properties of Phase-Pure Ba2Ti9O20 Microwave Resonators,” Mat.Res.Symp.Proc. Vol. 453, 501-506 (1997). (DOI: 10.1557/PROC-453-501)
69. J.R. Kokan and R.A. Gerhardt, “Sol-Gel Processing and Characterization of Silica Thin Films for On-Chip Humidity Sensors,” Mat.Res.Symp.Proc. Vol.446, 279-284 (1997). (DOI: 10.1557/PROC-446-279)
68. J.R. Kokan, G. Zhang and R.A. Gerhardt, “Porous Silica in Bulk and Thin Film Form for Use in Humidity Sensing Applications,” Proc. 6th Int. Wksp on Moisture in Microelectronics.
67. R.A. Gerhardt, “Electrically Based Microstructural Characterization of Composites,” Fourth International Conference on Composites Engineering, ICCE/4, pp. 102-103 (1997).
1996
66. A. Erbil, Y. Kim and R.A. Gerhardt , “Giant Permittivity in Epitaxial Ferroelectric Heterostructures,” Phys. Rev. Lett. 77, 1628-1631(1996). (DOI: 10.1103/PhysRevLett.77.1628)
65. K.J. Duchow and R.A. Gerhardt, “Dielectric Characterization of Wood and Wood Infiltrated with Ceramic Precursors,” Mat.Sc.& Eng. C4, 125-131(1996). Published online 8 February 1999. (DOI: 10.1016/0928-4931(95)00129-8)
64. R. Gerhardt, “Porous Silica: A Versatile Material for Microelectronic Applications,” Chapter in Hybrid Microelectronic Materials: Ceramic Transactions, Volume 68, American Ceramic Society, pp. 57-70 (1996). (ISBN: 9781574980134)
63. R.A. Gerhardt, S.R. Taylor and E.J. Garboczi, eds., Electrically based microstructural characterization, Materials Research Society Proceedings Volume 411, 435 pages (1996). (ISBN: 1-55899-314-2)
62. A. Kushwaha, R.A. Gerhardt, Y. Kim and A. Erbil, “Electrical Characterization of MOCVD Grown Epitaxial and Polycrystalline PLT Thin Films,” IEEE Proc. Tenth International Symposium on Applications of Ferroelectric ISAF ‘96, 337-340 (1996). (DOI: 10.1109/ISAF.1996.602762)
61. R.A. Gerhardt and W. Cao, “Distinguishing bulk water from adsorbed water via dielectric measurements,” IEEE Proc. CEIDP, 102-105(1996). (DOI: 10.1109/CEIDP.1996.564605)
60. Y. Kim, A. Erbil, A. Kushwaha and R.A. Gerhardt, “Study of Ferroelectric Thin Film Superlattices,” Mat.Res.Symp.Proc.vol. 433, 339-344 (1996). (DOI: 10.1557/PROC-433-339)
59. A.X. Coles, R.A. Gerhardt and A. Rohatgi, “Optimization of Porous Silicon Reflectance for Solar Cell Applications,” Mat.Res.Symp.Proc. Vol. 426,557-562 (1996). (DOI: 10.1557/PROC-426-557)
58. K.S. Meyers, G. Zhang and R.A. Gerhardt , “Dielectric Properties Dependence on Residual Sodium and Potassium Content in Silica Xerogels,” Mat.Res.Soc.Symp.Proc.Vol.411, 217-222 (1996). (DOI: 10.1557/PROC-411-217)
57. W.Y. Lin, R.A. Gerhardt and R.F. Speyer, “Complex Impedance Analysis of Silica Surface Film on Molybdenum Disilicide,” Mat. Res. Soc. Symp.Proc. vol. 411, 223-228 (1996). (DOI: 10.1557/PROC-411-223)
56. J.R. Kokan and R.A. Gerhardt, “Humidity Effects on Porous Silica Thin Films,” Mat.Res.Soc.Symp.Proc vol. 411, 419-424 (1996). (DOI: 10.1557/PROC-411-419)